All times in CET.
Download the book of abstracts. (~50 MB)
| Monday, 11 July | ||
| 9:00-10:00 | G. Hlawacek | FIT4NANO Core group meeting (on invitation only) |
| 10:00-12:00 | G. Hlawacek | FIT4NANO MC meeting (on invitation only) |
| 12:00-12:45 | Registration | |
| 12:45-13:00 | Welcome | |
| 13:00-13:30 | A. V. Krasheninnikov | Engineering the structure and properties of 2D materials by defect creation and intercalation |
| 13:30-13:50 | D. Tsoukalas | Demonstration of enhanced switching variability and conductance quantization properties in a SiO2 conducting bridge resistive memory with embedded 2D MoS2 material |
| 13:50-14:10 | D. Kölle | Nb and NbN constriction Josephson junctions and nanoSQUIDs patterned by He and Ne focused ion beams |
| 14:10-14:30 | S. Lohmann | Influence of crystal structure on helium-induced tendril formation in an FeCoCrNiV high-entropy alloy |
| 14:30-14:50 | A. Kuznetsov | Polymorphic transformations induced by ion beams |
| 14:50-15:20 | Coffee Break | |
| 15:20-15:50 | E. Bielejec | Overview of Sandia’s Focused Ion Beam Capabilities and the Development of Novel Sources for Implantation and Irradiation |
| 15:50-16:10 | D. C Cox | The Challenges of Deterministic Single Ion Implantation |
| 16:10-16:30 | H. Frerichs, QD Microscopy | Two Microscopes are better than One – In-situ Correlative Analysis by combination of AFM, SEM, and FIB |
| 16:30-16:50 | F. Zhou, Zeiss | Fabrication of micropillar array using LaserFIB for micromechanical testing |
| 16:50-17:10 | Coffee Break | |
| 17:10-17:30 | M. Perzanowski | A perspective for application of ion beams to modulate magnetic properties of thin films |
| 17:30-17:50 | M. Krupinski | Large scale arrays of nanomagnets and magnetically modulated patterns generated by ion irradiation |
| 17:50 -18:10 | V. Deinhart | Keeping skyrmions on the track by tailoring the magnetic anisotropy landscape with focused He-ion irradiation |
| 18:10-20:00 | Poster session | |
| Tuesday, 12 July | ||
| 9:00-9:30 | T. Löber | Benefits of a Cs FIB with a low temperature ion source compared to a standard Ga FIB |
| 9:30-9:50 | T. Wirtz | Advanced multimodal analytical capabilities on FIB instruments using SIMS: Do we need to care about primary ions? |
| 9:50-10:10 | T. Richter, Raith | Explore unlimited process pathways for FIB nanopatterning and ion imaging using VELION |
| 10:10-10:30 | M. Wu, Thermofisher | Advanced microstructure analysis using cutting edge multiple ion species plasma FIB |
| 10:30-11:00 | Coffee Break | |
| 11:00-11:30 | S. Guillous | PELIICAEN setup status: Performances and new developments for elaboration and characterization of materials at nanoscale |
| 11:30-11:50 | E. Salançon | Insulator on conductor ion source: first results and measurements |
| 11:50-12:10 | O. De Castro | Laser-cooled Cs+ source meets magnetic sector SIMS: a unique platform for highest sensi-tivitynano-analytics |
| 12:10-12:30 | K. Wieczerzak | Ion yields enhancement in FIB-TOF-SIMS by fluorine gas coinjection – A comprehensive study of 41 pure elements and multicomponent samples |
| 12:30-13:30 | Break | |
| 13:30-14:00 | G. L. Weiss | Combining cryo-FIB milling with cryo-electron tomography enables macromolecular insights into biological samples |
| 14:00-14:20 | A. Salvador-Porroche | High-throughput direct writing of metallic micro- and nanostructures by focused Ga+ beam irradiation of palladium acetate films |
| 14:20-14:40 | I. B. Szymańska | Selection of coordination compounds for the study of interactions with a focused ion beam |
| 14:40-15:00 | B.R. Jany | New Cu Precursors for Ion Beam Induced Deposition under Gallium FIB |
| 15:00-15:30 | Coffee Break | |
| 15:30-18:00 | G. Hlawacek G.Hobler K.Höflich T.Wirtz | WG1/2/3/4 meeting (open to all, parallel sessions) |
| 18:00 | Magic Krakow: walking tour through downtown Krakow | |
| 20:00 | Workshop Dinner | |
| Wednesday, 13 July | ||
| 9:00 – 9:30 | R. Córdoba | Additive nano‐manufacturing of advanced superconductors, and devices using focused ion beam technology |
| 9:30 – 9:50 | S. Kelly, Zeiss | The importance of data representivity in the analysis of modern battery materials: Why FIB tomography voxel size is critical? |
| 9:50 – 10:10 | L. McElwee-White | Comparison of Electron- and Ion-Induced Chemistry in FEBID/FIBID Precursors |
| 10:10 – 10:30 | P. Nag | Ion Induced Decomposition of Iron Pentacarbnonyl |
| 10:30 – 11:00 | Coffee break | |
| 11:00 – 11:30 | M. Toth | Nanofabrication and Knock-on Doping Using an Inert Plasma FIB and Solid/Gaseous Precursors |
| 11:30 – 11:50 | M. Wu, Thermofisher | Femtosecond laser integrated multiple species ion plasma FIB and its interaction with soft and hard materials |
| 11:50 – 12:10 | P. Le Gal, Orsay Physics | Comparative study of copper contents obtained by focused electron & ion beam induced deposition (Ga+, Xe+) with Cu(II)(hfac)2∙xH2O |
| 12:10 – 12:30 | M. Huth | Locally selective magnon excitation in FEBID/FIBID nanostructures |
| 12:30 – 14:00 | Break | |
| 14:00 – 14:30 | J. M. De Teresa | Recent advances in superconducting FIBID nanostructures and Cryo-FIBID |
| 14:30 – 15:00 | H. Fairbrother | Electrons/Ions Stimulated Surface Reactions of Organometallic Precursors |
| from 15:00 | Excursion to Cyclotron Center Bronowice | |
| Legend | ||
| Invited Speaker | ||
| Industry talk | ||
Poster presentations:
If your abstract was accepted as a poster, please prepare a vertical A0 poster; fixing material will be provided by the organizers.
- K. Berent, G. Brus, T.Prokop and J. Szmyd, Application of FIB/SEM tomography for the advanced microstructural characterization of solid oxide fuel cells
- E. Gacka, B. Pruchnik, T. Gotszalk, and I.W. Rangelow, Electron and ion beam deposited nanowires as probes for atomic force microscopy
- Bedrane, M. Lagaize, A. Houël, A. Delobbe, E. Salançon, Coaxial ion source: characterization of field ionization under gas flow
- Priebe, I. Utke, and J. Michler, Application of Fluorine Gas-Assisted FIB-TOF-SIMS for Chemical Characterization of Buried Thin Films and Quality Control of Deposition Process
- P.-H. Lu, M. Kruth, and R. E. Dunin-Borkowski, Focused ion beam-fabricated thin film phase masks for electron lens aberration correction and structured illumination electron ptychography
- K. Madajska, I. B. Szymańska, Binuclear rhenium(III) complexes with amidinate and amidate. Volatility and electron interaction studies
- A. Butrymowicz and I. B. Szymańska, New gold(I) and gold(II) complexes with amidinates as potential precursors for vapor deposition methods
- Lopes, T. Ferreira-Gonçalves, I. V. Figueiredo, C. Rodrigues, H. Ferreira, D. Ferreira, A. S. Viana, P. Faísca, M. Gaspar, J. Coelho, C. O. Silva, and C. P. Reis, Innovative and Minimally Invasive Therapy for Melanoma using a Hybrid Nanosyste Combined with NIR Laser Irradiation
- E. Khairi, J. Richter, K. Bolotin, H. C. Nerl and K. Höflich, Fabrication of nanostructured van der Waals heterostructures using He ion beam patterning
- Li, S. Xu, ,and E. J. D. Vredenbregt, Study of Focused Rb+ Ion Beam Applications
- Nykyruy, R. Yavorskyi, G. Wisz, P. Sawicka-Chudy, and B. Naidych, Structure and morphology of the surface of cadmium sulfide thin films
- M. Vesco, S. del Rossi, and S. Schintke, Plasma treatment and electrowetting on polymer thin films and nanofiber membranes
- A. Tsarapkin, V. Deinhart, T. Feichtner and K. Höflich, Direct Writing of Chiral and Nonlinear Plasmonic Devices
- T. Escalante-Quiceno, A. Salvador-Porroche, P. Orús, J. Pablo-Navarro, S. Sangiao, F. Sigloch, M. Barrado, P. Cea, C. Magén, J.M. De Teresa, Transfer of knowledge of new techniques based on Focused Electron/Ion Beam Induced Deposition (FEBID/FIBID)
- A.-T. Iacob, O.M. Ionescu, and L. Profire, Development and biological assessment in terms of cytotoxicity and hemolytic effect of hyaluronic acid (HA) based electrospun nanofibers
- O. M. Ionescu, A.- T. Iacob, A. Mignon, N. Simionescu, I. Gardikiotis, I.-D. Caruntu, S. E. Giusca, S. Van Vlierberghe, L. Profire, Polyethylene oxide-hyaluronic acid-based electrospun nanofibers: in vitro and in vivo studies
- P. Mazarov, W. Pilz, F. Meyer, Cobalt and Dysprosium Liquid Alloy Ion Sources for Magnetic Nanostructures