| Petr Bábor | Real time static SIMS Monitoring of Catalytic CO Oxidation to CO2 Over Platinum Surfaces | See more |
| J.B. Boissevain & Anthea Aguis Anastasi | Modifying Single-Layer and Bi-Layer Graphene using a Medium-Energy Electron Beam: A Raman Spectroscopy Study | See more |
| A. Butrymowicz | New volatile palladium(II) and nickel(II) perfluorinated amidine derivatives as potential precursor in FEBID/FIBID methods | See more |
| J. S. Cabaço | Transport properties of systematically disordered Cr2AlC films | 138 |
| A. Estry | FIB-Fabricated Micro-Resonators | 140 |
| Nicholas T.H.Farr | Observing Carbon in Electron and Ion Beam deposition within FIB-SEM | 142 |
| Ewelina Gacka | Utility Evaluation of GaN-tip Probes Fabricated in Focused Electron and Ion Beam Technology for Atomic Force Microscopy | See more |
| Gregor Hlawacek | FIT4NANO - Focused Ion Technology for functional nanomaterials | See more |
| A.T. Iacob | Development and biological assessment in terms of cytotoxicity and hemolytic effect of hyaluronic acid (HA) based electrospun nanofibers | 148 |
| A. Kolomiytsev | Application of the FIB induced deposition method for the fabrication of AFM probe tips | See more |
| Jinu Kurian | Helium Ion Microscopy Patterning for Perpendicular Magnetic Anisotropy Thin Films | See more |
| C. Larosa | The role of Americium-241 for the metal detection in solids liquids | See more |
| Y. Li | Characterization of an ultracold Rb+ focused ion beam | See more |
| V. Mandić | In-situ nanoindentation electron microscopy of the nanostructured semiconducting zincite thin-films | See more |
| V. Ondračka | Measuring slice thickness stability during a high resolution FIB-SEM serial-sectioning tomography | See more |
| M. Paśniewski | FIB-SEM on Polyolefins: Influence of Different Ion Beam Conditions | 162 |
| A. Salvador-Porroche | Ultrafast growth of cobalt nanostructures using Cryo-FIBID: application to electrical contacts on graphene magnetism and hard masking 164 | 164 |
| C. Putzke | Advances in Low-Strain FIB Microstructures | 166 |
| S. Schintke | Atmospheric Pressure Plasma Treatment of Polymer Thin Films and Polymer Nano- and Microfiber Membranes | See more |
| Kent. R. Shirer | On-chip geometry-induced strain in strongly correlated mesoscale structured materials | 170 |
| F. Sigloch | Tungsten based SQUID Nanofabrication by Means of Focused Ion Beam Induced Deposition | 172 |
| J. P. B. Silva | Ion-beam sputtered ferroelectric ZrO2 thin films | See more |
| J. Stauffenberg | Combining nanometrology and nanomanufacturing using a Nanofabrication Machine (NFM-100) | See More |
| A. Szkudlarek | Removal of graphene and SiO2 by water-assisted Focused-Electron-Beam-Induced Etching | See more |
| J. Turczyński | FIB preparation of thin metallic glassy films for in-situ thermal TEM examination | 180 |
| M. R. van Delft | Engineering the Strain-sensitive Superconductivity of CeIrIn5 with FIB | 182 |
| K. Weinel | Complex artificial Features on a TEM grid fabricated with FIB Technology combined with Micromanipulation | See more |
| W. Zajkowska | Contacting ZnO nanowires with platinum paths | 186 |
