Program
download oral contribution abstracts
Wednesday
| 09:30 | Get Together & Registration | ||
| Tutorial | 10:00 | FIB preparation of lamellae on chips for in-situ TEM and other techniques – J. Reuteler (download tutorial (PDF)) download abstract | |
| 12:00 | LUNCH | ||
| Session n°1 | Talk 1 | 13:00 | Tungsten based SQUID Nanofabrication by means of Focused Ion Beam Induced Deposition – F. Sigloch download abstract |
| Talk 2 | 13:25 | Comparing Contrast in nano-CT and FIB/SEM Tomography of an Al Cast Alloy – A Correlative Microscopy Study – C. Pauly download abstract | |
| Exi 1 | 13:50 | Explore unlimited process pathways for FIB nanopatterning and ion imaging using VELION – T. Richter (Raith) download abstract | |
| Talk 3 | 14:15 | 3D Nanoprinting of Electrical AFM Nanoprobes – L. M. Seewald download abstract | |
| 14:45 | COFFEE BREAK | ||
| Session n°2 | Inv 1 | 15:30 | Manipulation and Study of Antiferromagnetic Order Enabled by Focused Ion Beam Fabrication – S. Haley download abstract |
| Talk 4 | 16:05 | Backside FIB/SEM analysis strategy to identify a new failure mode at an automotive magnetic sensor device – M. Simon-Najasek download abstract | |
| Exi 2 | 16:30 | in situ Force Measurements – the FIB/SEM as a Mechanical Characterization Tool – A.J. Smith (Kleindiek) download abstract | |
| Talk 5 | 16:55 | Development and SEM integration of the Nano Aperture Ion Source – M.L. Simons download abstract | |
| Exi 3 | 17:20 | Extending microstructure characterization from nm to mm scale using the latest multiple ion species plasma FIB integrated with femtosecond laser. – M. Wu (Thermo-Fisher) download abstract | |
| 17:45 | Food Truck + beers + posters |
Thursday
| 08:30 | Get Together | ||
| Session n°3 | Talk 6 | 09:00 | The patterning toolbox FIB-o-mat: Exploiting the full potential of focused ion beams for nanofabrication – K. Höflich download abstract |
| Inv 2 | 09:25 | Focused Ion Beam Induced Strain Generation in Silicon Membranes – D. Cox download abstract | |
| Exi 4 | 10:00 | Two Microscopes are better than One – In-situ Correlative Analysis by combination of AFM, SEM, and FIB – H. Frerichs (Quantum Design) download abstract | |
| 10:25 | COFFEE BREAK | ||
| Session n°4 | Talk 7 | 11:00 | Direct-Write 3D Nanoprinting of High-Resolution Magnetic Force Microscopy Nanoprobes – M. Brugger-Hatzl download abstract |
| Inv 3 | 11:25 | Using the Helium Ion Microscope for Imaging and Modification of Nanostructures, 2D Materials, and SARS-CoV-2 infected Cells – Armin Gölzhäuser download abstract | |
| Exi 5 | 12:00 | Next chapter in Nanoprototyping in the new generation of FIBSEM systems – Miloš Hrabovský (Tescan) | |
| 12:30 | LUNCH + Discussions | ||
| Session n°5 | Talk 8 | 14:00 | Sample preparation and analysis of LLZO ceramics for solid state batteries with Cryo FIB/SEM and aberration corrected analytical STEM – C. J. Burkhardt download abstract |
| Talk 9 | 14:25 | Helium ion microscopy and sectioning of Spider Silk – J. Fiutowski download abstract | |
| Inv 4 | 14:50 | Best Practices for Xe PFIB Preparation of Materials for Transmission Electron Microscopy – S. Vitale download abstract | |
| Exi 6 | 15:25 | New Applications in Energy Research Enabled by a Triple Beam, Dual Chamber FIB with Isotropic Tomographic Voxels – B. Tordoff (Zeiss) download abstract | |
| Talk 10 | 15:50 | Application of FIB-TOF-SIMS for 3D high-resolution chemical characterization of Li-ion solid-state batteries – A. Priebe download abstract | |
| 16:15 | POSTER SESSION COFFEE / BEER | ||
| 18:30 | Meet at Rickmer Rickmers for Conference Dinner |
Friday
| 08:30 | Get Together | ||
| Session n°6 | Talk 11 | 09:00 | On demand spatially controlled fabrication of single photon emitters in Si – G. Hlawacek download abstract |
| Inv 5 | 09:25 | Magnetic patterning using Ne, Co, and Dy FIB – K. Lenz download abstract | |
| Exi 7 | 10:00 | TOFWERK – fibTOF: The strength of SIMS capabilities on FIB-SEM microscopes – L. Pillatsch download abstract | |
| 10:25 | COFFEE BREAK | ||
| Session n°7 | Talk 12 | 11:00 | Positioned generation of luminescence defects in 2D materials by helium ion beams – A. Hötger download abstract |
| Talk 13 | 11:25 | Fabrication of microstructured devices for grain boundary investigations in unconventional superconductor CeCoIn5 – S. Mishra download abstract | |
| Talk 14 | 11:50 | Exploring Layered Conductors by 3D FIB micro-machining – C. Putzke download abstract | |
| Talk 15 | 12:15 | Investigation of the Interaction of a Ga+ Focused Ion Beam with Zirconia by Electron Backscatter Diffraction – N. Brachhold download abstract | |
| 12:40 | CLOSING |
Invited Speakers
David Cox | University of Surrey | United Kingdom
“Focused Ion Beam Induced Strain Generation in Silicon Membranes”
Armin Gölzhäuser | University of Bielefeld | Germany
Shannon Haley | University of California, Berkeley | United States
“Manipulation and Study of Antiferromagnetic Order Enabled by Focused Ion Beam Fabrication”
Kilian Lenz | Helmholtz Zetnrum Dresden Rossendorf | Germany
“Magnetic patterning using Ne, Co, and Dy FIB”
Suzy Vitale | Carnegie Institution for Science | United States
“Best Practices for Xe PFIB Preparation of Materials for Transmission Electron Microscopy”
Invited Tutorial
Joakim Reuteler | ETH Zürich | Switzerland
“Tutorial: FIB preparation of lamellae on chips for in-situ TEM and other techniques”
download tutorial (PDF)
Posters: (presenting author, title) download all poster abstracts
Braun et al. – Focused Ion Beam Induced Nanoscale Phase Transitions in Layered Structures download abstract
Elyas et al. – The Manufacture of van der Waals Heterostructures Using He Ion Beam Patterning download abstract
Gotszalk et al. – High throughput tips manufacturing for active piezocantilevers with xenon ion beam with mass control download abstract
Guo et al. – Crystalline anisotropic curtaining effect in Bismuth download abstract
Hunter et al. – Micromachined samples for uniaxial strain studies with laser-ARPES download abstract
Kreps et al. – In-situ sample preparation of oxidizing and contaminating samples for high quality EDS and WDS quantification using FIB-SEM download abstract
Leissner et al. – Dual focused ion beam nanofabrication of V-grooves in monocrystalline gold for efficient excitation of organic single photon emitters download abstract
Nadzeyka et al. – Novel FIB nanofabrication strategies facilitated by light and heavy ions from GaBiLi Liquid Metal Alloy Ion Sources download abstract
Neupane et al. – Effect of Focused Helium-ion Beam on Surface Morphology of Polypropylene Thin-films for Power Capacitors download abstract
Smith et al. – Fault Localization in FIB/SEM – combining delayering and EBAC into a cohesive workflow download abstract
Vinograd et al. – Second order Zeeman interaction and ferroquadrupolar order in TmVO4 download abstract
Weitzer et al. – Using Electron Beam Curing (EBC) for the Controlled Bending of 3D-Nanoprinted FEBID Structures download abstract
Weitzer et al. – High-Precision 3D-Nanoprinting for Sheet-like Structures via FEBID download abstract
Winiarski – Correlative Microscopy for Aviation and Aerospace download abstract
Winiarski et al. – Plasma FIB spin milling hastens battery research download abstract
Winiarski et al. – Plasma FIB-SEM-based Kintsugi Imaging for Battery Electrodes download abstract
Winkler et al. – The FIB as 3D Nanoprinter – Overview of the Activities in Graz download abstract