The recently published thematic issue “Focused ion and electron beams for synthesis and characterization of nanomaterials” in the Beilstein Journal of Nanotechnology showcases the latest developments in nanofabrication and characterization using charged particle beams. Initiated in connection with the joint meeting of FIT4NANO and FEBIP communities during the Focused Charged Particle Week in Krakow (2022), this collection brings together cutting-edge research on topics such as precursor chemistry, nanoscale 3D structuring, FEBID/FEBIE processing, and ion beam interactions with soft matter.
Many of the featured contributions stem from active members of the EU-FIB.net community, highlighting its leading role in driving innovation and collaboration in focused ion beam science. The issue also reflects on key challenges—including reproducibility and scalability—while outlining perspectives for integrating artificial intelligence and modeling into next-generation beam-based nanotechnologies.
Read the editorial and access the full issue here: https://doi.org/10.3762/bjnano.16.47