As previously announced, the Beilstein Journal of Nanotechnology is publishing a special issue on Focued Ion and electron beams for synthesis and characterization of nanomaterials. The submission deadline has been extended until 29th February 2024.
All information is available at https://www.beilstein-journals.org/bjnano/theJournal
EU-FIB.net is a collaborative network dedicated to advancing Focused Ion Beam (FIB) processing and related technologies. Our mission is twofold: to improve existing concepts, technologies, and partnerships while fostering new, interdisciplinary approaches and collaborations across Europe and beyond.
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The EU-FIB.net Steering Committee
