Abstract Submission
Based on the EUFN mission we invite all FIB users to present and discuss their results including scientists, engineers and technicians. We kindly ask you to submit your contribution(s) for a presentation at the EUFN Workshop 2018 which includes but is not limited to the following topics:
- Basics I: Theoretical Fundamentals, Modelling and Simulations of FIB Processes
- Basics II: Chemistry in FIB processes
- Basics III : Advances in Gas Field Ion Source Microscopes (He, Ne, Ar, Kr, Xe, …)
- Basics IV: FIB Based Analytics (SIMS, EDXS, EBSD, Raman, …), FIB Tomography
- Basics V: Novel (interdisciplinary) Processing Concepts (laser, in situ, dynamic, …)
- Applications I: Site Specific Metrology and Specimen Preparation (TEM, APT, XCT)
- Applications II: Circuit Edit
- Application III: Specimen pre-preparation
- Application IV: Subtractive Micro- and Nanofabrication
- Applications V: Gas Assisted Processing via Focused Particle Beams
- Applications VI: FIB Processing in Lifesciences, Biotechnology and Soft Matter
Please follow our submission guidelines:
- Please use our A5 TEMPLATE for the abstract preparation which also includes style guidelines (Word or PDF) for a common style in the abstract booklet (no further editing from our side will be done).
- Once you have composed your abstract please send it per email to Guillaume Audoit with the email subject “EUFN 2018 Abstract”
- Submit your abstract on April 30th at latest.
- Please keep in mind that the number of available talks is limited so that some oral presentations preferences will be invited for a poster presentation.
Further details:
- You will be notified about the abstract decision till May 22nd 2018
- All presenters are kindly invited to provide a full or stripped-down version of their presentation after the EUFN workshop. They will be uploaded to a password protected sub-page to be available for attendees after the conference.
- Please dont forget to visit our Registration section.